The reflectometer is a neutron scattering instrument designed for the study of surfaces, interfaces and thin films. It uses the reflection of a neutron beam from a sample to accurately characterize its structure and properties at the nanometer scale.

This instrument makes it possible to determine the thickness, density, roughness and composition of very thin layers. It is widely used in the fields of advanced materials, nanotechnology, energy, chemistry and life sciences.

Within the framework of the ICONE project, the reflectometer is one of the major instruments designed to provide researchers with advanced access to surface and interface analysis, contributing to the development of new generations of functional materials.